The <MM1897> features a built-in latch-up release function (patent pending) with (1) Latch-up detection ⇒ (2) Power source shut-off ⇒ (3) Latch-up release ⇒ (4) Automatic recovery sequence, which helps to prevent damage to micro-computers caused by latch-up.
The use of bi-polar processing and a noise suppression element result in a design that makes it difficult for the IC itself to cause damage due to latch-up or static electricity.
Results of static electricity noise/electric field noise/magnetic field noise tests that comply with IEC61000-4-2 (Electrostatic Discharge Immunity Tests) have show a much better ability to withstand noise than Mitsumi's previous products.
- Latch-up Release Function (current detection threshold, detection delay time and recovery delay time can be set)
- Resilient against noise (IEC61000 Contact Discharge Test immunity 25kV)
- Wide operating voltage range (maximum operating voltage 14V)
|Power supply voltage||VOUT (Typ.) +0.5 to 14V
(absolute maximum rating : -0.3V to 15V)
|Operating temperature range||-30~+85℃|
|Consumption current||3mA typ.|
|Consumption current when OFF||10µA max.|
|Output voltage||A rank 5.0V typ. ±2%|
|B rank 3.3V typ. ±2%|
|Input/output voltage difference||0.1V typ. (VCC-0.2V, IOUT=50mA)|
|Abnormal current detection current *1||100mA typ. (RLATCH=2kΩ)|
|Abnormal current detection delay time *2||1.0ms typ. (CD=0.1µF)|
|Output recovery time *3||10ms typ. (CR=0.1µF)|
|Package||DIP-8, DIP-16, SOP-16|
| *1 Can be set with external resistance RLATCH
*2 Can be set with external capacity CD
*3 Can be set with external capacity CR
* Specifications may change due to modifications or improvements
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